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Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS

Published online by Cambridge University Press:  25 July 2016

P. Statham ,
J. Sagar ,
J. Holland ,
J. Manktelow  and
S. Lozano-Perez
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks HP12 3SE, U.K.
J. Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks HP12 3SE, U.K.
J. Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks HP12 3SE, U.K.
J. Manktelow
Affiliation:
University of Oxford, Department of Materials, Oxford OX1 3PH, U.K.
S. Lozano-Perez
Affiliation:
University of Oxford, Department of Materials, Oxford OX1 3PH, U.K.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 38 - 39
Copyright
© Microscopy Society of America 2016 

References

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