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Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

Published online by Cambridge University Press:  23 November 2012

Z. Gan ,
D.J. Smith ,
M.R. McCartney ,
D.E. Perea  and
S.T. Picraux
Z. Gan
Affiliation:
Arizona State University, Tempe, AZ
D.J. Smith
Affiliation:
Arizona State University, Tempe, AZ
M.R. McCartney
Affiliation:
Arizona State University, Tempe, AZ
D.E. Perea
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
S.T. Picraux
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1826 - 1827
Copyright
Copyright © Microscopy Society of America 2012

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