Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T00:02:18.306Z Has data issue: false hasContentIssue false
  • English
  • Français

Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF

Published online by Cambridge University Press:  01 August 2018

Jeff Gelb ,
Benjamin Stripe ,
Xiaolin Yang ,
Sylvia Lewis ,
SH Lau  and
Wenbing Yun
Jeff Gelb
Affiliation:
Sigray, Inc., Concord, CA, USA
Benjamin Stripe
Affiliation:
Sigray, Inc., Concord, CA, USA
Xiaolin Yang
Affiliation:
Sigray, Inc., Concord, CA, USA
Sylvia Lewis
Affiliation:
Sigray, Inc., Concord, CA, USA
SH Lau
Affiliation:
Sigray, Inc., Concord, CA, USA
Wenbing Yun
Affiliation:
Sigray, Inc., Concord, CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1058 - 1059
Copyright
© Microscopy Society of America 2018 

References

[1] Merkle, A P Gelb, J Microscopy Today 21 2013) p. 10–15.Google Scholar
[2] Arai, T in Handbook of Practical X-Ray Fluorescence Analysis (ed. B Beckhoff, B Kanngießer, N Langhoff, R Wedell and H Wolff Springer Heidelberg p. 1–26.Google Scholar