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Mapping Strain and Relaxation in 2D Heterojunctions with Sub-picometer Precision

Published online by Cambridge University Press:  01 August 2018

Yimo Han ,
Kayla Nguyen ,
Michael Cao ,
Paul Cueva ,
Mark W. Tate ,
Prafull Purohit ,
Saien Xie ,
Ming-Yang Li ,
Lain-Jong Li  and
Jiwoong Park
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Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY.
Kayla Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY.
Michael Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY.
Paul Cueva
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY.
Mark W. Tate
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY.
Prafull Purohit
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY.
Saien Xie
Affiliation:
Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL.
Ming-Yang Li
Affiliation:
Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, Kingdom of Saudi Arabia.
Lain-Jong Li
Affiliation:
Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, Kingdom of Saudi Arabia.
Jiwoong Park
Affiliation:
Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL.
Sol M. Gruner
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY. Physics Department, Cornell University, Ithaca, NY. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY. Cornell High Energy Synchrotron Source, Cornell University, Ithaca, NY.
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1588 - 1589
Copyright
© Microscopy Society of America 2018 

References

[1] Han, Y., et al, Nature Materials 17 2018) p. 129.Google Scholar
[2] Han, Y., et al, arXiv:1801.08053 (2018).Google Scholar
[3] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[4] Funded by the Cornell Center for Materials Research, an NSF MRSEC (DMR-1719875).Google Scholar