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Mapping Polar Distortions with Nanobeam Electron Diffraction with a Cepstral Approach

Published online by Cambridge University Press:  22 July 2022

Megan E. Holtz ,
Elliot Padgett ,
Aaron Johnston-Peck ,
Igor Levin ,
David Muller  and
Andrew Herzing
Megan E. Holtz*
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA School of Applied and Engineering Physics, Cornell University, Ithaca, New York, 14853, USA George S. Ansell Department of Metallurgical & Materials Engineering, Colorado School of Mines, Golden, Colorado 80401, USA
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, 14853, USA
Aaron Johnston-Peck
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA
Igor Levin
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, 14853, USA
Andrew Herzing
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 468 - 469
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Copyright
Copyright © Microscopy Society of America 2022

References

Padgett, E., Holtz, M. E., Cueva, P., Shao, Y.-T., Langenberg, E., Schlom, D. G., and Muller, D. A., Ultramicroscopy 214, 112994 (2020).CrossRefGoogle Scholar