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Mapping Picometer Scale Periodic Lattice Distortions with Aberration Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Benjamin H. Savitzky
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA.
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA.
Alemayehu S. Admasu
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA. Rutgers Center for Emergent Materials, Rutgers University, Piscataway, NJ 08854, USA.
Jaewook Kim
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA. Rutgers Center for Emergent Materials, Rutgers University, Piscataway, NJ 08854, USA.
Sang-Wook Cheong
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA. Rutgers Center for Emergent Materials, Rutgers University, Piscataway, NJ 08854, USA.
Robert Hovden
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
Lena F. Kourkoutis
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY 14853, USA. Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY 14853, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Yankovich, A. B., et al., Nature Communications 5 2014 17.CrossRefGoogle Scholar
[2] Mundy, J. A., et al, Nature 537 2016 523527.Google Scholar
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[4] BHS acknowledges support from the NSF GRFP (DGE-1144153). This work was supported by the AFOSR (FA 9550-16-1-0305), NSF MRI award (DMR-1429155), the Packard Foundation, and made use of the CCMR shared facilities funding from the NSF MRSEC program (DMR-1120296).Google Scholar