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Mapping Magnetic Properties of Materials At Atomic Spatial Resolution

Published online by Cambridge University Press:  23 September 2015

Jan Rusz ,
Juan-Carlos Idrobo ,
Alexander Edstrom ,
Jakob Spiegelberg  and
Somnath Bhowmick
Jan Rusz
Affiliation:
Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden
Juan-Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Alexander Edstrom
Affiliation:
Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden
Jakob Spiegelberg
Affiliation:
Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden
Somnath Bhowmick
Affiliation:
Indian Institute of Technology, Kanpur, India

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 499 - 500
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Schattschneider, P., et al.., Nature 441, 486 (2006).Google Scholar
[2] Uchida, M. & Tonomura, A., Nature 464, 737 (2010).Google Scholar
[3] Verbeeck, J., Tian, H. & Schattschneider, P., Nature 467, 301 (2010).CrossRefGoogle Scholar
[4] McMorran, B., et al.., Science 331, 192 (2011).Google Scholar
[5] Lidbaum, H., et al.., Phys. Rev. Lett. 102, 037201 (2009).CrossRefGoogle Scholar
[6] Rusz, J., Idrobo, J. C. & Bhowmick, S., Phys. Rev. Lett. 113, 145501 (2014).CrossRefGoogle Scholar
[7] Pennycook, S. J. & Nellist, P. D., Scanning Transmission Electron Microscopy: Imaging and Analysis. (Springer, New York, 2011). Chap. 2.Google Scholar
[8] Pohl, D., et al.., Ultramic 150, 15 (2015).Google Scholar
[9] Idrobo, J. C., et al.., submitted.Google Scholar
[10] This research was supported by the Swedish Research Council and STINT (J.R., A.E, J.S., S.B), and by the Center for Nanophase Materials Sciences (CNMS), which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (J.C.I.)..Google Scholar