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Manipulation of single atoms and molecules by electron probe and mechanical force

Published online by Cambridge University Press:  30 July 2021

Nan Yao
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey, United States
Guangming Cheng
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey, United States
Pengcheng Chen
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey, United States
Nan Yao
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey, United States
Guangming Cheng
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey, United States
Pengcheng Chen
Affiliation:
Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, NJ08544, USA Email: [email protected], [email protected] and [email protected]

Abstract

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Type
Microscopy and Microanalysis for Real World Problem Solving
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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The authors acknowledge the use of Princeton's Imaging and Analysis Center (IAC), which is partially supported by the Princeton Center for Complex Materials (PCCM), a National Science Foundation (NSF) Materials Research Science and Engineering Center (MRSEC; DMR-2011750).Google Scholar