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Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Published online by Cambridge University Press:  27 August 2014

A. Akhtari-Zavareh ,
L.P. Carignan ,
A. Yelon ,
D. Ménard ,
T. Kasama ,
R. Herring ,
R. E. Dunin-Borkowski ,
M. R. McCartney  and
K. L. Kavanagh
A. Akhtari-Zavareh
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, V5A1S6, Canada
L.P. Carignan
Affiliation:
Apollo Microwaves, 1650 Trans-Canada Highway, Dorval, Qc, H9P 1H7, Canada
A. Yelon
Affiliation:
Department of Engineering Physics, École Polytechnique de Montréal, Montréal, Québec, H3C 3A7, Canada
D. Ménard
Affiliation:
Department of Engineering Physics, École Polytechnique de Montréal, Montréal, Québec, H3C 3A7, Canada
T. Kasama
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
R. Herring
Affiliation:
Department of Mechanical Engineering, University of Victoria, Victoria, B.C., V8W 3P6, Canada
R. E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, D-52425 Jülich, Germany
M. R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA
K. L. Kavanagh
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, V5A1S6, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 280 - 281
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Ross, C. A., Smith, H. I., Savas, T., Schattenburg, M., Farhand, M., Huang, M., Walsh, M., Abraham, M. C., and Ram, R. J. J. Vac. Sci. Technol. B 17, 3168 (1999.Google Scholar
[2] Fert, A., Piraux, L., Magn, J. Magn. Mater. 200, 338 (1999.Google Scholar
[3] Carignan, L. P., Yelon, A., Ménard, D., and Caloz, C. IEEE Trans. Microw. Theory Tech. 59, 2568 (2011.Google Scholar
[4] Reich, D. H., Tanase, M., Hultgren, A., Bauer, L. A., Chen, C. S., Meyer, G. J. J. Appl. Phys. 93, 7275 (2003.Google Scholar
[5] Carignan, L.P., Lacroix, C., Ouimet, A., Ciureanu, M., Yelon, A., and Ménard, D. J. Appl. Phys. 102,023905 (2007.Google Scholar
[6] Shindo, D. and Murakami, Y. J. Phys. D: Appl. Phys. 41, 125 (2008.Google Scholar