Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-15T15:16:18.196Z Has data issue: false hasContentIssue false
  • English
  • Français

The M Emission Spectrum of 68Erbium

Published online by Cambridge University Press:  09 May 2007

Jan Dellith  and
Michael Wendt
Jan Dellith
Affiliation:
Institut für Physikalische Hochtechnologie, Albert-Einstein-Strasse 9, D-07745 Jena, Germany
Michael Wendt
Affiliation:
Institut für Physikalische Hochtechnologie, Albert-Einstein-Strasse 9, D-07745 Jena, Germany
Get access

Abstract

The M emission spectrum of 68Er was reinvestigated using wavelength dispersive spectrometry, with a TAP diffracting crystal. By recording the spectra using the second-order reflection, an improved energy resolution was achieved, which is necessary to resolve the M5O3 line from the neighboring α M5N7 transition. In addition to the five lines/bands tabulated in the classical paper of Bearden, a number of further lines were observed. These are M1N3, M3O1, M2N1, M5O3, M3N1, and M4N3. For all the lines with an energy below the M5 absorption structure (M5O3, M3N1, M4N3, and ζ M5N3), an increasing relative intensity with increasing energy of the exciting electrons, E0, was observed. This dependence has its origin in the fact that these lines are normally absorbed whereas Mα (M5N7) and Mβ (M4N6) are additionally affected by anomalous line-type absorption.

Keywords

X-ray spectrometryelectron microprobe analysiswavelength dispersive spectrometry (WDS)erbiumM emission spectrumrelative intensities
Type
SPECIAL SECTION: MICROANALYSIS OF MATERIALS TODAY
Information
Microscopy and Microanalysis , Volume 13 , Issue 3 , June 2007 , pp. 191 - 195
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Bearden, J.A. (1967). X-ray wavelengths. Rev Mod Phys 39, 78–124.Google Scholar
Bearden, J.A. & Burr, A.F. (1967). Reevaluation of X-ray atomic energy levels. Rev Mod Phys 39, 125–142.Google Scholar
Dellith, J. & Wendt, M. (2004). Electron excited M X-ray spectra of the elements 55 ≤ Z ≤ 58. Microchim Acta 145, 25–28.Google Scholar
Fischer, D.W. & Baun, W.L. (1967). Self-absorption effects in the soft X-ray Mα and Mβ emission spectra of the rare earth elements. J Appl Phys 38, 4830–4836.Google Scholar
Lábár, J.L. & Salter, C.J. (1991). Uncertainties in the analysis of M X-ray lines of the rare-earth elements. In Electron Probe Quantitation, Heinrich, K.F.J. & Newbury, D.E. (Eds.), pp. 223–249. New York: Plenum Press.
Stewardson, E.A. & Wilson, J.E. (1956). The MIV,V spectra of 68Er. Proc Phys Soc (Lond) 69A, 93–101.Google Scholar
Wendt, M. & Christ, B. (1985). The relative intensity of Mz-lines. Crystal Res Technol 20, 1443–1449.Google Scholar
White, E.W. & Johnson, G.G. (1970). X-ray Emission and Absorption Wavelengths and Two-Theta Tables, 2nd ed., ASTM Data Series DS 37. Philadelphia: ASTM.