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Low-Loss EELS Investigations on Atomically Thin MoxW(1-x)S2 Nanoflakes for Delving into Their Optoelectronic Properties

Published online by Cambridge University Press:  01 August 2018

M. Pelaez-Fernandez ,
Y.C. Lin ,
K. Suenaga  and
R. Arenal
M. Pelaez-Fernandez
Affiliation:
Instituto de Nanociencia de Aragon, Univ. Zaragoza, Zaragoza, Spain
Y.C. Lin
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan
K. Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan
R. Arenal
Affiliation:
Instituto de Nanociencia de Aragon, Univ. Zaragoza, Zaragoza, Spain ARAID, Zaragoza, Spain

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1576 - 1577
Copyright
© Microscopy Society of America 2018 

References

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[11] This work was supported by the Spanish MINECO (MAT2016-70776-P) and the EU, under G. A. 604391 and 696656. Low-loss EELS developed at the LMA of the INA - U. Zaragoza (Spain).Google Scholar