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Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source

Published online by Cambridge University Press:  23 September 2015

I.-S. Hwang ,
W.-T. Chang ,
C.-Y. Lin  and
W.-H. Hsu
I.-S. Hwang
Affiliation:
Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan
W.-T. Chang
Affiliation:
Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan
C.-Y. Lin
Affiliation:
Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan Department of Physics, National Taiwan University, Taipei, Taiwan
W.-H. Hsu
Affiliation:
Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 839 - 840
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Fu, TY, Cheng, LC, Nien, CH & Tsong, TT, Phys. Rev. B 64 (2001) 113401.Google Scholar
[2] Kuo, HS, Hwang, IS, Fu, TY, Wu, JY, Chang, CC & Tsong, TT, Nano Lett 4 (2004) 2379.CrossRefGoogle Scholar
[3] Chang, CC, Kuo, HS, Hwang, IS & Tsong, TT, Nanotechnology 20 (2009) 115401.Google Scholar
[4] Gabor, D, Nature 161 (1948) 777.CrossRefGoogle Scholar
[5] The authors acknowledge funding from Academia Sinica of R. O. C. (AS-99-TP-A02).Google Scholar