Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-06T13:37:41.309Z Has data issue: false hasContentIssue false
  • English
  • Français

Low voltage STEM observation in the latest FE-SEM

Published online by Cambridge University Press:  09 October 2013

N. Sakamoto ,
S. Takeuchi ,
K. Koyama ,
M. Sasajima  and
H. Sato
N. Sakamoto
Affiliation:
S. Takeuchi
Affiliation:
K. Koyama
Affiliation:
M. Sasajima
Affiliation:
H. Sato
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 386 - 387
Copyright
Copyright © Microscopy Society of America 2013