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Low Temperature Scanning Electron Microscopy of Soft Bodied Organisms

Published online by Cambridge University Press:  02 July 2020

Eric F. Erbe ,
William P. Wergin ,
Ronald Ochoa ,
Joseph C. Dickens  and
William Moser
Eric F. Erbe
Affiliation:
Nematology Laboratory, Beltsville, MD20705.
William P. Wergin
Affiliation:
Nematology Laboratory, Beltsville, MD20705.
Ronald Ochoa
Affiliation:
**, Systematic Entomology Laboratory, Beltsville, MD20705.
Joseph C. Dickens
Affiliation:
Chemicals Affecting Insect Behavior Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, MD20705.
William Moser
Affiliation:
National Museum of Natural History, Smithsonian Institution. , Washington, DC20560
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Abstract

Resolving the true fine structure and behavior of soft bodied organisms such as arthropod larvae, acari, nematodes, annelids and pupae by conventional scanning electron microscopy has been difficult. Classical preparation techniques, involving immersion fixation, dehydration and critical point drying, cause significant deleterious changes in specimen structure due to effects of surface tension, osmotic stress and mechanical damage. The intact exoskeleton, cuticle or other limiting membranes of these organisms, creates a formidable obstacle to the penetration of fixatives and solvents, which are only effective after a long period of time (hours). During this time, behavioral postures and much of the structural integrity are lost and most organisms detach from their hosts.

In previous studies, our laboratory utilized methods in low temperature freeze stabilization, to preserve and observe the undisturbed fine structure of biological samples. Plunge freezing, although more rapid, resulted in many parasitic organisms dislodging from hosts and being lost.

Type
Recent Techniques for the Fixation and Staining of Biological Samples (Organized by M. Sanders and K. McDonald)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1204 - 1205
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

1.Wergin, W. P et al., Scanning 22(2000)145.CrossRefGoogle ScholarPubMed
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4.Dickens, J. C. et al, Insect Physiol 41(1995)857.CrossRefGoogle Scholar