Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-25T01:40:43.583Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM

Published online by Cambridge University Press:  05 August 2019

Peter Schweizer ,
Peter Denninger ,
Christian Dolle ,
Stefanie Rechberger  and
Erdmann Spiecker
Peter Schweizer*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University, Erlangen, Germany
Peter Denninger
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University, Erlangen, Germany
Christian Dolle
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University, Erlangen, Germany
Stefanie Rechberger
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University, Erlangen, Germany
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander University, Erlangen, Germany
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 450 - 451
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Schweizer, P, Dolle, C, and Spiecker, E, Sci. Adv. 4 (2018) eaat4712.Google Scholar
[2]Thompson, C V, Annu. Rev. Mater. Res. 42 (2012), 399-434.Google Scholar