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Low Energy MeV Ion Beams, Microscopy and Non-Destructive Surface Analysis of Materials

Published online by Cambridge University Press:  31 July 2015

J. Pacheco de Carvalho ,
C. F. R. Pacheco  and
A. D. Reis
J. Pacheco de Carvalho
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
C. F. R. Pacheco
Affiliation:
Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
A. D. Reis
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal
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Abstract

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Type
Materials Science
Information
Microscopy and Microanalysis , Volume 21 , Issue S5: INCOMAM'14 International Conference on Microscopy and Microanalysis , August 2015 , pp. 19 - 20
Copyright
© Microscopy Society of America 2015

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References

[1]Tesmer, J. R. & Nastasi, M. (Eds.), Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Pittsburgh, PA, 1995.Google Scholar
[2]Amsel, G. & Battistig, G., Nucl. Instr. and Meth. B 240, 2005). pp. 1–12.10.1016/j.nimb.2005.06.078Google Scholar
[3]Calvert, J. M., et al.., J. Phys. D: Appl. Phys 7, 1974). pp. 940–953.10.1088/0022-3727/7/7/303Google Scholar
[4]Pacheco de Carvalho, J. A. R. & Reis, A. D., Bol. Soc. Esp. Ceram 47(4, 2008). pp. 252–257.10.3989/cyv.2008.v47.i4.186Google Scholar
[5]Pacheco de Carvalho, J. A. R., et al., Nucl. Instr. and Meth. B 269(24, 2011). pp. 3054–3056.10.1016/j.nimb.2011.04.079Google Scholar
[6]Pacheco de Carvalho, J., et al., Microsc. Microanal 19(S4, 2013). pp. 133–134.10.1017/S1431927613001281Google Scholar
[7]Barradas, N.P., et al., Nucl. Instr. and Meth. B 262, 2007). pp. 281–303.10.1016/j.nimb.2007.05.018Google Scholar
[8] Supports from Universidade da Beira Interior and FCT (Fundação para a Ciência e a Tecnologia) PEst-OE-FIS/UI0524/2014 (Projeto Estratégico-UI524-2014) are acknowledged.Google Scholar