Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T10:48:42.991Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy BSE Imaging with a New Scintillation Detector

Published online by Cambridge University Press:  23 September 2015

J. Kolosova ,
J. Jiruse ,
J. Fiala  and
J. Beranek
J. Kolosova
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Jiruse
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Fiala
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Beranek
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 703 - 704
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Bell, DC Erdman, N in "Low Voltage Electron microscopy: Principles and Applications" ed. DC BellN Erdman John Wiley & Sons Chichester p. 1 Google Scholar
[2] Frank, L et al Materials 5 2012 p. 2731 CrossRefGoogle Scholar
[4] Jiruse, J et al Microscopy and Microanalysis 20 2014 p. 990 CrossRefGoogle Scholar