Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T15:03:46.031Z Has data issue: false hasContentIssue false
  • English
  • Français

Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations

Published online by Cambridge University Press:  01 August 2018

Eliska Mikmekovâ ,
Ales Patâk ,
Ilona Mullerovâ ,
Ludëk Frank ,
Benjamin Daniel ,
Ivo Konvalina ,
Tomâs Rihâcek ,
Martin Zouhar ,
Anna Zaporozchenko  and
Michael Lejeune
Eliska Mikmekovâ
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ales Patâk
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ilona Mullerovâ
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ludëk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Benjamin Daniel
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ivo Konvalina
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Tomâs Rihâcek
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Martin Zouhar
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Anna Zaporozchenko
Affiliation:
Institute of Physics, University of Mainz, Mainz, Germany
Michael Lejeune
Affiliation:
Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, Amiens, France.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1564 - 1565
Copyright
© Microscopy Society of America 2018 

References

[1] Bhimanapati, G R, et al, ACS Nano 9 2015) p. 11509.Google Scholar
[2] Drouin, D, et al, Scanning 29 2007) p. 92.Google Scholar
[3] Giannozzi, P, et al, Journal of Physics: Condensed Matter 21 2009) p. 395502.Google Scholar
[4] Corso, A Dal Computational Materials Science 95 2014) p. 337.Google Scholar
[5] McClain, J Doctoral dissertation, University of New Hampshire (2015).Google Scholar
[6] The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118).Google Scholar