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Lorentz And Interference Electron Microscopy On A Scanning Tem

Published online by Cambridge University Press:  02 July 2020

Y. Yajima  and
Y. Takahashi
Y. Yajima
Affiliation:
Central Research Laboratory, HITACHI, Ltd., Kokubunji, Tokyo, 185-8601, JAPAN
Y. Takahashi
Affiliation:
Central Research Laboratory, HITACHI, Ltd., Kokubunji, Tokyo, 185-8601, JAPAN
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Magnetic imaging can be performed both on conventional (projection) and scanning TEM (CTEM/STEM). The CTEM-based magnetic imaging, classified into Fresnel, Foucault, holography, and other modes, has proven successful by now in observing various magnetic objects, and has accordingly been well documented elsewhere. The STEMbased one has emerged relatively recently prompted by the rapid growth of current STEM technology.

The most ubiquitous implementation of Lorentz microscopy on a STEM is the differential phase contrast (DPC) mode. Each scanning signal obtained in the DPC mode is linear to Lorentz deflection, thus reflects the magnitude of an in-plane component of magnetic induction integrated along the optical axis(Fig.l). The signals therefore suffice to generate integrated in-plane magnetic induction maps(Fig.2). Furthermore, by making use of the fact that the Lorentz deflection distribution across the image plane forms an irrotational (vortex-free) 2D vector field, a pertinent numerical image processing yields a function equivalent to the electron phase function representing magnetically distorted electron wavefront.

Type
Magnetic Imaging And Its Application To Materials
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 38 - 39
Copyright
Copyright © Microscopy Society of America

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References

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