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Locating the 'missing wedge' artifacts from limited-angle CT reconstruction

Published online by Cambridge University Press:  10 August 2018

Jianhong Liu ,
Yong Guan ,
Liang Chen ,
Haobo Bai ,
Wenbin Wei ,
Yangchao Tian  and
Gang Liu
Jianhong Liu
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Yong Guan*
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Liang Chen
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Haobo Bai
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Wenbin Wei
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Yangchao Tian
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Gang Liu
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
*
*Yong Guan, yongg @ustc.edu.cn

Abstract:

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'Missing wedge' problem exists in some kind of CT imaging situations, such as electron microscopy, x-ray nano-CT image, etc. Method such as iterative reconstruction algorithms, total variation based method were applied to improve the reconstruction quality, but the 'missing wedge' artifacts are still inevitable. In this paper, a method based on image processing technique was proposed to locate the 'missing wedge' artifacts in CT reconstruction. The result showed good performance on locating the artifacts, which also showed the potential in CT reconstruction and image analysis in nano-CT.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 138 - 139
Copyright
© Microscopy Society of America 2018 

References

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