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Localised Charging Effects Induced In Nonconductive Materials During Focused Ion Beam Milling

Published online by Cambridge University Press:  24 July 2003

Marion A. Stevens-Kalceff ,
Sergey Rubanov  and
Paul R. Munroe
Marion A. Stevens-Kalceff
Affiliation:
School of Physics and Electron Microscope Unit, University of New South Wales, Sydney, NSW 2052, Australia
Sergey Rubanov
Affiliation:
School of Physics and Electron Microscope Unit, University of New South Wales, Sydney, NSW 2052, Australia
Paul R. Munroe
Affiliation:
School of Materials Science and Engineering and Electron Microscope Unit, University of New South Wales, Sydney, NSW 2052, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 878 - 879
Copyright
Copyright © Microscopy Society of America 2003