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Local Layer Stacking and Structural Disorder in Graphene Oxide Studied via Scanning Electron Diffraction.

Published online by Cambridge University Press:  04 August 2017

Alexander S. Eggeman ,
Rowan K. Leary ,
Duncan N. Johnstone  and
Paul A. Midgley
Alexander S. Eggeman
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Rowan K. Leary
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Duncan N. Johnstone
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1754 - 1755
Copyright
© Microscopy Society of America 2017 

References

[1] Wilson, N. R., et al, ACS Nano 3 2009). p. 2547–2556.Google Scholar
[2] Dave, S. H., et al, ACS Nano 10 2016). p. 7515–7522.Google Scholar
[3] Mkhoyan, K. A., et al, Nano Letters 9 2008 1058–1063.Google Scholar
[4] Huang, P., et al, Nature 469 2011). p. 389–392.Google Scholar
[5] Butz, B., et al, Nature 505 2014). p. 533–537.Google Scholar
[6] Meyer, J. C., et al, Solid State Communications 143 2007). p. 101–109.CrossRefGoogle Scholar
[7] Moeck, P., et al, Cryst. Res. Technol. 46 2011). p. 589–606.Google Scholar
[8] This work has received funding from the EU Seventh Framework Programme under Grant Agreement 312483 -ESTEEM2 and from the ERC Ref. 291522 3DIMAGE. RKL acknowledges a Junior Research Fellowship at Clare College. ASE acknowledges funding from the Royal Society..Google Scholar