Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T05:16:43.944Z Has data issue: false hasContentIssue false
  • English
  • Français

Local Crystallography for Quantitative Analysis of Atomically Resolved Images

Published online by Cambridge University Press:  25 July 2016

Alex Belianinov ,
Qian He ,
Mikhail Kravchenko ,
Stephen Jesse ,
Albina Borisevich  and
Sergei V. Kalinin
Alex Belianinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831.
Qian He
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831.
Mikhail Kravchenko
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831.
Stephen Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831.
Albina Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831. Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831.
Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 948 - 949
Copyright
© Microscopy Society of America 2016 

References

[1] Belianinov, A, He, Q, Kravchenko, M, Jesse, S, Borisevich, A & Kalinin, S V. Identification of phases, symmetries and defects through local crystallography. Nature Communications 6, 7801.Google Scholar
[2] Shiju, N. R. & Guliants, V. V. Recent developments in catalysis using nanostructured materials. Applied Catalysis A: General 356, 1-17 doi:10.1016/j.apcata.2008.11.034 (2009).Google Scholar
[3] Xiahan Sang, Adedapo A. Oni & LeBeau, James M. Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation. Microsc. Microanal. doi:10.1017/S1431927614013506.CrossRefGoogle Scholar
[4] Sarahan, M.C., Chi, M., Masiel, D.J. & Browning, N.D. Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy 111 3, pp. 251–257, 2011.CrossRefGoogle ScholarPubMed
[5] Jones, L. & Nellist, P.D. Identifying and correcting scan noise and drift in the scanning transmission electron microscope (2013). Microscopy and Microanalysis 19 4, pp. 1050–1060.Google Scholar
[6] Research for all authors was supported by the US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division. This research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U. S. Department of Energy.Google Scholar