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Local Chemical and Deformation Profiles in InAs/AlSb Multilayer Structures for Quantum Cascade Lasers

Published online by Cambridge University Press:  23 September 2015

B. Warot-Fonrose ,
J. Nicolai ,
M. Vallet ,
C. Gatel ,
R. Teissier ,
A. N. Baranov ,
C. Magen  and
A. Ponchet
B. Warot-Fonrose
Affiliation:
CEMES CNRS-UPR 8011, Universite de Toulouse, 31055 Toulouse, France Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza
J. Nicolai
Affiliation:
CEMES CNRS-UPR 8011, Universite de Toulouse, 31055 Toulouse, France Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza
M. Vallet
Affiliation:
CEMES CNRS-UPR 8011, Universite de Toulouse, 31055 Toulouse, France Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza
C. Gatel
Affiliation:
CEMES CNRS-UPR 8011, Universite de Toulouse, 31055 Toulouse, France Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza
R. Teissier
Affiliation:
IES CNRS-UMR 5214, 34095 Montpellier, France
A. N. Baranov
Affiliation:
IES CNRS-UMR 5214, 34095 Montpellier, France
C. Magen
Affiliation:
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de Aragon (INA) -ARAID and Departamento de Fisica de la Materia Condensada, Universidad de Zaragoza, 50018 Zaragoza, Spain Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza
A. Ponchet
Affiliation:
CEMES CNRS-UPR 8011, Universite de Toulouse, 31055 Toulouse, France Transpyrenean Associated Laboratory for Electron Microscopy (TALEM), CEMES-INA, CNRS-Universidad de Zaragoza

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1925 - 1926
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Devenson, J., et al, Applied Physics Letters 91 (2007) 141106.CrossRefGoogle Scholar
[2] Nicolai, J., et al, Applied Physics Letters 104 (2014) 031907.CrossRefGoogle Scholar
[3] Acknowledgements: The authors are grateful to C. Crestou for TEM samples thinning. This work is supported by the French national project NAIADE (ANR-11-BS10-017) and the European Union Seventh Framework Programme under Grant Agreement 312483 - ESTEEM2 (Integrated Infrastructure Initiative-I3).Google Scholar