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Letter to the Editor: Accurate Element Identification is the Core Requirement for a Microanalysis System

Published online by Cambridge University Press:  14 July 2006

Simon Burgess
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe HP12 3SE, UK E-mail: [email protected]
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Extract

We at Oxford Instruments were interested to read the article published in Microscopy and Microanalysis by Newbury (2005). Although our own views differ from those of Dr. Newbury in some respects, we do agree that this is an important matter. If this article generates an interest in the ability of a system and a user to accurately identify elements in a spectrum and encourages people to assess the quality of the qualitative analysis provided by a microanalysis system, then we believe this article has served a very useful purpose. After all, accurate element identification is the core requirement for a microanalysis system.

Type
LETTER TO THE EDITOR
Information
Microscopy and Microanalysis , Volume 12 , Issue 4 , August 2006 , pp. 281 - 282
Copyright
© 2006 Microscopy Society of America

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References

REFERENCES

Duncumb, P. & Statham, P.J. (2002). Benefits of X-ray spectrum simulation at low energies. Mikrochimica Acta 138, 249–258.CrossRefGoogle Scholar
Duncumb, P., Barkshire, I.R., & Statham, P.J. (2001). Improved X-ray spectrum simulation for electron microprobe analysis. Microsc Microanal 7, 341–355.CrossRefGoogle Scholar
Newbury, Dale E. (2005). Misidentification of major constituents by automatic qualitative energy dispersive X-ray microanalysis: A problem that threatens the credibility of the analytical community. Microsc Microanal 11, 545–561.CrossRefGoogle Scholar
Statham, P.J. (2002). Limitations to accuracy in extracting characteristic line intensities from X-ray spectra. J Res Natl Inst Stand Technol 107, 531–546.CrossRefGoogle Scholar
Statham, P.J. (2004). A check total for validating standardless and normalised EDX analysis at low kV. Microchimica Acta 145, 229–235.CrossRefGoogle Scholar
Statham, P.J. (2006). Practical issues for quantitative X-ray microanalysis in SEM at low kV. Microscopy Today 14, 30–32.CrossRefGoogle Scholar