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Learning From Scanning Transmission Electron Microscopy to Enhance Transmission X-ray Microscopy: How We Can Merge STEM and TXM Datasets?

Published online by Cambridge University Press:  25 July 2016

X. Yang ,
D. Gürsoy ,
C. Phatak ,
V. De Andrade ,
E. B. Gulsoy  and
F. De Carlo
X. Yang
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, USA.
D. Gürsoy
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, USA.
C. Phatak
Affiliation:
Materials Science Division, Argonne National Laboratory, Lemont, USA
V. De Andrade
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, USA.
E. B. Gulsoy
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Chicago, USA.
F. De Carlo
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 240 - 241
Copyright
© Microscopy Society of America 2016 

References

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