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LBNL and the Materials Microcharacterization Collaboratory

Published online by Cambridge University Press:  02 July 2020

M.A. O'Keefe ,
J.R. Taylor  and
D.K. Owen
M.A. O'Keefe
Affiliation:
National Center for Electron Microscopy, LBNL B72, Berkeley, CA, 94720
J.R. Taylor
Affiliation:
Information and Computing Sciences Division, LBNL B50B, Berkeley, CA, 94720
D.K. Owen
Affiliation:
National Center for Electron Microscopy, LBNL B72, Berkeley, CA, 94720
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Extract

In 1996 the DOE formed the Materials Microcharacterization Collaboratory (MMC) to bring together the four DOE-sponsored electron microscope user facilities in one collaboratory. The MMC will bring the microanalysis and microcharacterization tools that are available in national centers to geographically dispersed researchers working in industries, universities, and Government laboratories. It will enable these remote users to share on-line the instrumentation, knowledge and expertise available at the individual facilities making up the collaboratory.

LBNL first demonstrated on-line remote control of a high-voltage TEM from Kansas City in 1995 in a joint project by LBNL computer scientists and NCEM microscopists. The microscope chosen was a 1.5MeV Kratos EM-1500 that is used for in-situ electron microscopy. In the demonstration, a specimen of an Al/Pb alloy was heated and observed, with remote-operator control of heating rate, microscope focus, and stage movement (translation and tilt).

Type
Advances in Remote Microscopy, Instrument Automation and Data Storage
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 42 - 43
Copyright
Copyright © Microscopy Society of America

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References

1. Wright, M.C.in 56th Ann. Proc. MSA, Atlanta, GA (1998) these proceedings.Google Scholar

2. Parvin, B. et al, in 53rd Ann Proc. MSA, Kansas City, Missouri (1995) 82–83.Google Scholar

3. O'Keefe, M.A. et al, in 54th Ann. Proc. MSA, Minneapolis, Minnesota (1996) 384-385.Google Scholar

4. Taylor, J. and Parvin, B., in 54th Ann. Proc. MSA, Minneapolis, Minnesota (1996) 388–389.Google Scholar

5. Haider, M. and Uhlemann, S.in 56th Ann. Proc. MSA, Atlanta, GA (1998) these proceedings.Google Scholar

* Work supported by Director, Office of Energy Research — through the Office of Basic Energy Sciences, Material Sciences Division and through the Office of Computational and Technology Research, Mathematical Information and Computational Sciences — of the U.S. Department of Energy, under contract No. DE-AC03-76SF00098.