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Lattice-Vibration Limited Resolution, 3D Depth Sectioning and High Dose-Efficient Imaging via Multislice Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Zhen Chen*
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Megan E. Holtz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA
Michal Odstrčil
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Manuel Guizar-Sicairos
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Isabelle-Mercedes Schulze-Jonack
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany
Steffen Ganschow
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany
Darrell G. Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Copyright
Copyright © Microscopy Society of America 2022

References

Ophus, C, Microscopy and Microanalysis 25 (2019), p. 563. doi: 10.1017/S1431927619000497CrossRefGoogle Scholar
Philipp, H et al. , arXiv:2111.05889 (2021).Google Scholar
Zhou, L, et al. , Nat. Commun. 11 (2020), p. 2773. doi: 10.1038/s41467-020-16391-6CrossRefGoogle Scholar
Jiang, Y, et al. , Nature 559 (2018), p. 343. doi: 10.1038/s41586-018-0298-5CrossRefGoogle Scholar
Hovden, R, et al. , Physical Review B, 86 (2012), p. 195415. doi: 10.1103/PhysRevB.86.195415CrossRefGoogle Scholar
Hÿtch, MJ and Stobbs, WM, Ultramicroscopy 53 (1994), p. 191. doi: 10.1016/0304-3991(94)90034-5CrossRefGoogle Scholar
Brown, HG, et al. , Physical Review Letters 121 (2018), p. 266102. doi: 10.1103/PhysRevLett.121.266102CrossRefGoogle Scholar
Jiang, Y, et al. , Microscopy and Microanalysis 24 (2018), p. 192. doi: 10.1017/S1431927618001459CrossRefGoogle Scholar
Schloz, M, et al. , Optics Express 28 (2020), p. 28306. doi: 10.1364/OE.396925CrossRefGoogle Scholar
Chen, Z, et al. , Science 372 (2021), p. 826. doi: 10.1126/science.abg2533CrossRefGoogle Scholar
Maiden, AM, et al. , J. Opt. Soc. Am. A 29 (2012), p. 1606. doi: 10.1364/JOSAA.29.001606CrossRefGoogle Scholar
Research supported by US NSF (grants DMR-2039380 and DMR-1719875).Google Scholar