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Large-Collection-Angle BF STEM Imaging of Compound Semiconductors

Published online by Cambridge University Press:  23 September 2015

T. Aoki ,
M.R. McCartney  and
David J. Smith
T. Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, AZ 85287-1704, USA
M.R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1921 - 1922
Copyright
Copyright © Microscopy Society of America 2015 

References

1. Liu, J. & Cowley, J. M., Ultramicroscopy 52 (1993) 335–346.Google Scholar
2. Smith, D. J., et al., Microscopy 62 (2013) S65–S73.Google Scholar
3 Smith, D.J., et al., J. Phys. Conf. Ser. 471 (2013) 012005.Google Scholar
4. We acknowledge the use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University..Google Scholar