Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T12:28:32.020Z Has data issue: false hasContentIssue false
  • English
  • Français

Large-Aperture STEM Hexapole Cs-Corrector

Published online by Cambridge University Press:  22 July 2022

S. Uhlemann ,
T. Riedel ,
P. Hartel ,
S. Perl ,
M. Linck ,
V. Gerheim  and
H. Müller
S. Uhlemann*
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
T. Riedel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
P. Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
S. Perl
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
M. Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
V. Gerheim
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
H. Müller
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2630 - 2632
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Müller, H. et al. , Microsc. Microanal. 12 (2006) 442-455.CrossRefGoogle Scholar
Sawada, H. et al. , J. Electron Microsc. 58 (2009) 341-347.CrossRefGoogle Scholar
Bischoff, M. et al. , Microsc. Microanal. 24 (2018) 1134-1135.CrossRefGoogle Scholar
Morishita, S. et al. , Microscopy 67 (2018) 156-163.CrossRefGoogle Scholar
Watanabe, M. et al. , Microsc. Microanal. 22 (2016) 310-311.CrossRefGoogle Scholar
Hartel, P. et al. , Ultramicroscopy 206 (2019) 112821.CrossRefGoogle Scholar
Intaraprasonk, V. et al. , Ultramicroscopy 108 (2008) 1454-1466.CrossRefGoogle Scholar
Morishita, S. et al. , Phys.Rev.Let. 117 (2016) 153004.CrossRefGoogle Scholar
Ishikawa, R. et al. , Ultramicroscopy 151 (2015) 122-129.CrossRefGoogle Scholar
Sagawa, R. et al. , Ultramicroscopy 233 (2022) 113440.CrossRefGoogle Scholar
We acknowledge and highly appreciate the collaboration and support by JEOL company.Google Scholar