Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T23:40:22.683Z Has data issue: false hasContentIssue false

Large volume 3D characterization by plasma FIB DualBeam microscopy

Published online by Cambridge University Press:  23 September 2015

T L Burnett
Affiliation:
The University of Manchester, Materials Department, Manchester, M13 9PL, UK FEI Company, Achtseweg Noord 5, Bldg 5651 GG, Eindhoven, The Netherlands
R Kelley
Affiliation:
FEI Company, 5350 Northeast Dawson Creek Drive, Hillsboro, OR 97124, USA
B Winiarski
Affiliation:
The University of Manchester, Materials Department, Manchester, M13 9PL, UK FEI Company, Achtseweg Noord 5, Bldg 5651 GG, Eindhoven, The Netherlands
M Daly
Affiliation:
The University of Manchester, Materials Department, Manchester, M13 9PL, UK
K Mani
Affiliation:
FEI Company, 5350 Northeast Dawson Creek Drive, Hillsboro, OR 97124, USA
P J Withers
Affiliation:
The University of Manchester, Materials Department, Manchester, M13 9PL, UK

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

Refrences

1. Maire, E. & Withers, P. J.: 'Quantitative X-ray tomography'. Int. Mater. Rev. (2014) 59(1), 143.CrossRefGoogle Scholar
2. Uchic, M. D., Holzer, L. & Inkson, B. J., E. L. Principe. P. Munroe 'Three-Dimensional Microstructural Characterization Using Focused Ion Beam Tomography' MRS Bulletin Volume 32(Issue 05, May 2007). pp 408416.Google Scholar
3. Borgh, I., et al., On the three-dimensional structure of WC grains in cemented carbides. Acta Mat (2013) 61, 47264733.CrossRefGoogle Scholar
4. Kubel, C., Voigt, A., Schoenmakers, R., Otten, M., Su, D., Lee, T-C., Carlsson, A. & Bradley, J. 'Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications. Microscopy and Microanalysis 11(Issue 05 (2005). pp 378400.Google Scholar
5. Blavettea, D. & Duguay, S., Atom probe tomography in nanoelectronics. European Physical Journal - Applied Physics (2014). 68( (p. 10101p1-12.Google Scholar
6. Burnett, T.L., McDonald, S.A., Gholinia, A. & Geurts, R., Janus. M., Slater, T., Haigh, S.J., Ornek, C., Almuaili, F.,Engelberg, D.L., Thompson (2014). p. 4711.Google Scholar