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Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM

Published online by Cambridge University Press:  27 August 2014

A. Niculae ,
M. Bornschlegl ,
R. Eckhardt ,
J. Herrmann ,
S. Jeschke ,
G. Krenz ,
A. Liebel ,
G. Lutz ,
H. Soltau  and
L. Strüder
A. Niculae
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
M. Bornschlegl
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
R. Eckhardt
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
J. Herrmann
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
S. Jeschke
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
G. Krenz
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
G. Lutz
Affiliation:
PNSensor GmbH, Römerstr. 28, 80803 München, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, 81735 München, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Römerstr. 28, 80803 München, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1124 - 1125
Copyright
Copyright © Microscopy Society of America 2014