Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-24T13:53:38.874Z Has data issue: false hasContentIssue false

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling

Published online by Cambridge University Press:  04 August 2017

P. Nowakowski
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
M.L. Ray
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
P.E. Fischione
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Zaefferer, S & Wright, SI in Electron backscatter diffraction in materials science (eds. AJ Schwartzet al Springer Bostonp. 109.Google Scholar
[2] Birosca, S, et al, Acta Mater. 59 2011). p. 1510.Google Scholar
[3] Zaefferer, S, Wright, SI & Raabe, D Metall. Mater. Trans. 39 2008). p. 374.Google Scholar
[4] Khorashadizadeh, A, et al, Adv. Eng. Mater. 13 2011). p. 237.Google Scholar
[5] Burnett, TL, et al, Ultramicroscopy 161 2016). p. 119.Google Scholar
[6] Saowadee, N, Agersted, K & Bowen, JR Jour. Microsc. (Oxford, U.K.) 246 2012). p. 279.Google Scholar
[7] Lin, FX, et al, Mat. Charact 61 2010). p. 1203.Google Scholar
[8] Nowakowski, P, et al, Microsc. Microanal. 22 2016). p. 12.Google Scholar
[9] Nowakowski, P, et al, European Microscopy Congress Proceedings 2016). p. 1082.Google Scholar