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La Dopant Segregation at Threading Dislocations in La:BaSnO3 Thin Films

Published online by Cambridge University Press:  30 July 2020

Hwanhui Yun ,
Abhinav Prakash ,
Bharat Jalan  and
K. Andre Mkhoyan
Hwanhui Yun
Affiliation:
University of Minnesota-Twin Cities, Minneapolis, Minnesota, United States
Abhinav Prakash
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Bharat Jalan
Affiliation:
University of Minnesota-Twin Cities, Minneapolis, Minnesota, United States
K. Andre Mkhoyan
Affiliation:
University of Minnesota-Twin Cities, Minneapolis, Minnesota, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2478 - 2479
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Copyright
Copyright © Microscopy Society of America 2020

References

Hull, D. et al. ., “Introduction to Dislocations”, fifth edition, (Butterworth-Heinemann, Oxford)Google Scholar
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Prakash, A. et al. ., Nat. Comm. 2017, 8, (1), 15167.Google Scholar
Prakash, A. et al. ., J. Vac. Sci. Technol. A 2015, 33, (6), 060608.Google Scholar
Hÿtch, M. J. et al. ., Ultramicroscopy 1998, 74, (3), 131-146.10.1016/S0304-3991(98)00035-7CrossRefGoogle Scholar
The project was partially supported by UMN MRSEC program DMR-1420013. Film growth and characterization was primarily supported by the U.S. DOE BES through the Grant DE-SC-0020211.Google Scholar