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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization, Second Volume Sascha Sadewasser and Thilo Glatzel (Eds.), Springer Series in Surface Sciences, Book 65, 2018, 521 pp. ISBN: 9783319756868

Published online by Cambridge University Press:  12 December 2019

Rüdiger Berger
Rüdiger Berger*
Affiliation:
Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany
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Type
Book Review
Information
Microscopy and Microanalysis , Volume 25 , Issue 6 , December 2019 , pp. 1509 - 1510
Copyright
Copyright © Microscopy Society of America 2019 

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