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Iteratively Reweighted Least Square Fitting for Low Loss EELS Imaging of Radiation Sensitive Materials

Published online by Cambridge University Press:  23 November 2012

S. Yakovlev ,
K.H. Downing  and
N.P. Balsara
S. Yakovlev
Affiliation:
LBNL, Berkeley, CA
K.H. Downing
Affiliation:
LBNL, Berkeley, CA
N.P. Balsara
Affiliation:
LBNL, Berkeley, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1652 - 1653
Copyright
Copyright © Microscopy Society of America 2012

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