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Is it Really that Easy to Solve Surface Structures Using Direct Methods?

Published online by Cambridge University Press:  02 July 2020

L. D. Marks
L. D. Marks*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL60208, USA
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A basic problem in surface science is that, unlike bulk materials, very few of the atomic scale structures are known despite many years of effort. Even the advent of STM has not helped that much since it is difficult to impossible to interpret images without a-priori information. Transmission electron diffraction (or x-ray diffraction) data from surfaces represent a unique opportunity for the application of Direct Methods to solve surface structures, opening up new avenues for science. Diffraction from a surface when the bulk is only weakly dynamical is at least 90% kinematical, but it may be the case that strong (surface) scattering is buried under bulk reflections including the lxl or “surface forbidden bulk-allowed” reflections. In addition, further out in the diffraction pattern subsurface relaxation effects become very important, and these cannot be considered using conventional Direct Methods; instead of sharp atomic-features the true exit wave will have small positive/negative dipoles.

Type
Electron Crystallography; The Electron Phase Problem
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1023 - 1024
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Marks, L. D., Plass, R. and Dorset, D. L., Surf. Rev. & Letts., in pressGoogle Scholar
2.Gilmore, C., Marks, L. D., Grozea, D.,Collazo, C., Landree, E. and Twesten, R., Surf. Sei., in pressGoogle Scholar
3.Collazo-Davila, C., Marks, L. D., Nishii, K., and Tanishiro, Y., Surf. Rev. & Lett., in press.Google Scholar
4.Landree, E., Marks, L. D. and Zschak, P., submitted to Surf. Sci.Google Scholar
5.Marks, L. D., Grozea, D., Gilmore, C. and Fiedenhans'l, R., in preparationGoogle Scholar
6.Gilmore, C., Acta Cryst. A52 (1996) 561.10.1107/S0108767396001560CrossRefGoogle Scholar
7.Landree, E. and Marks, L. D., submitted to Acta Cryst.Google Scholar
8.Marks, L. D. and Landree, E., submitted to Acta Cryst.Google Scholar
9.Marks, L. D. and Plass, R., Phys. Rev. Lett. 75 (1995) 2172.10.1103/PhysRevLett.75.2172CrossRefGoogle Scholar