Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-08T05:06:18.495Z Has data issue: false hasContentIssue false
  • English
  • Français

Is a TEM for “Real World” Application Available Presently?

Published online by Cambridge University Press:  02 July 2020

W. Probst ,
G. Benner ,
B. Kabius ,
G. Lang ,
S. Hiller ,
V. Seybold  and
E. Zellmann
W. Probst
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
G. Benner
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
B. Kabius
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
G. Lang
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
S. Hiller
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
V. Seybold
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
E. Zellmann
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss Str.56, 73447 , Oberkochen, Germany
Get access

Abstract

Transmission electron microscopes have been built along with and guided by technological opportunities since the last five decades. Even though there are some “workhorse” type of microscopes, these instruments are still more or less built from the technological viewpoint and less from the viewpoint of ease of use in a wide range of applications. On the other hand, leading edge applications are the drivers for the development and the use of leading edge technology. The result then is a “race horse” which is of very limited benefit in “Real world”.

During the last decade computers have been integrated to build microscope systems. in most cases, however, computers still have to deal with obsolete electron optical ray path designs and thus, have to be used more to overcome the problems of imperfect optics and bad design of ray paths than to provide optimized “Real world” capabilities.

Type
Microscopy in the Real World: Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 522 - 523
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)