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Ion Beam Induced Current Measurements of Solar Cells with Helium Ion Microscopy

Published online by Cambridge University Press:  04 August 2017

Alex Belianinov ,
Songkil Kim ,
Cannon Buechley ,
Matthew Burch ,
Olga Ovchinnikova  and
Stephen Jesse
Alex Belianinov
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831 The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Songkil Kim
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831 The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Cannon Buechley
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831
Matthew Burch
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831 The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Olga Ovchinnikova
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831 The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, 37831 The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2084 - 2085
Copyright
© Microscopy Society of America 2017 

References

[1] David, C Joy Helium Ion Microscopy: Principles and Applications, First ed. Springer, New York USA, Heidelberg Germany, Dordrecht Netherlands, London United Kingdom, 2013.Google Scholar
[2] Gölzhauser, A. & Hlawacek, G. Helium Ion Microscopy. Springer International Publishing 2016.Google Scholar
[3] Donolato, C. Theory of beam induced current characterization of grain boundaries in polycrystalline solar cells. Journal of Applied Physics 54(3), 1314–1322, 1983.Google Scholar
[4] Chen, J., Sekiguchi, T., Yang, D. Yin., et. al Electron-beam-induced current study of grain boundaries in multicrystalline silicon. Journal of Applied Physics 96(10), 5490–5495, 2004.Google Scholar
[5] Manfredotti, C., Fizzotti, F., Polesello, P. Trapani, et.al Investigation on the electric field profile in CdTe by ion beam induced current. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 380(1-2), 136–140, 1996.Google Scholar
[6] This research was supported by Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (S.K., C.B., M.B., O.O.), and by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U. S. Department of Energy (A.B., S.J.).Google Scholar