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Investigation of the GaP/Si Interface by High-Resolution Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

A Beyer ,
J Ohlmann ,
M Luysberg  and
K Volz
A Beyer
Affiliation:
Philipps-University Marburg, Germany
J Ohlmann
Affiliation:
Philipps-University Marburg, Germany
M Luysberg
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH
K Volz
Affiliation:
Philipps-University Marburg, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1390 - 1391
Copyright
Copyright © Microscopy Society of America 2011