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Investigation of Electron Momentum Density in Carbon Nanotubes Using Transmission Electron Microscopy

Published online by Cambridge University Press:  04 September 2019

Zhenbao Feng*
Affiliation:
School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng 252059, China
Hefu Li
Affiliation:
School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng 252059, China
Zongliang Wang
Affiliation:
School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng 252059, China
Xiaoyan Zhang
Affiliation:
School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng 252059, China
Hengshuai Li
Affiliation:
School of Mechanical and Automotive Engineering, Liaocheng University, Liaocheng 252059, China
Haiquan Hu
Affiliation:
School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng 252059, China
Dangsheng Su
Affiliation:
Dalian National Laboratory for Clean Energy, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China
*
*Author for correspondence: Zhenbao Feng, E-mail: [email protected]
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Abstract

Valence Compton profiles (CPs) of multiwall (MWCNTs) and single-wall carbon nanotubes (SWCNTs) were obtained by recording electron energy-loss spectra at large momentum transfer in the transmission electron microscope, a technique known as electron Compton scattering from solids (ECOSS). The experimental MWCNT/SWCNT results were compared with that of graphite. Differences between the valence CPs of MWCNTs and SWCNTs were observed, and the SWCNT CPs indicate a greater delocalization of the ground-state charge density compared to graphite. The results clearly demonstrate the feasibility and potential of the ECOSS technique as a complementary tool for studying the electronic structure of materials with nanoscale spatial resolution.

Type
Materials Applications
Copyright
Copyright © Microscopy Society of America 2019 

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