Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T16:48:34.575Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigating Stress-Assisted Grain Growth in Nanocrystalline Materials Using in-situ Transmission Kikuchi Diffraction

Published online by Cambridge University Press:  04 August 2017

Pat Trimby ,
Glenn Sneddon ,
Vijay Bhatia  and
Julie M. Cairney
Pat Trimby
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, U.K. Australian Centre for Microscopy & Microanalysis, The University of Sydney, Sydney, Australia.
Glenn Sneddon
Affiliation:
Australian Centre for Microscopy & Microanalysis, The University of Sydney, Sydney, Australia.
Vijay Bhatia
Affiliation:
Australian Centre for Microscopy & Microanalysis, The University of Sydney, Sydney, Australia.
Julie M. Cairney
Affiliation:
Australian Centre for Microscopy & Microanalysis, The University of Sydney, Sydney, Australia.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 538 - 539
Copyright
© Microscopy Society of America 2017 

References

[1] Gianola, D.S., et al, Acta Materialia 54 2006). p 2253–2263.Google Scholar
[2] Luo, X.-M., et al, Nature Communications 5, 3021 2014.Google Scholar
[3] Keller, R.R. & Geiss, R.H. J. Microscopy 245 2012). p 245–251.Google Scholar
[4] Trimby, P.W. Ultramicroscopy 120 2012). p 16–24.CrossRefGoogle Scholar
[5] Sneddon, G., et al, Materials Science and Engineering R: Reports 110 2016). p 1–12.CrossRefGoogle Scholar
[6] The authors acknowledge the technical staff at the Australian Centre for Microscopy & Microanalysis at the University of Sydney. Dr. Gyuseok Kim is thanked for providing the Cu sample.Google Scholar