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Investigating Ca Segregated to a Grain Boundaries in MgO Using Multiple Scattering Analysis of Electron Energy Loss Spectra

Published online by Cambridge University Press:  02 July 2020

J. P. Buban ,
J. Zaborac ,
H. Moltaji ,
G. Duscher  and
N. D. Browning
J. P. Buban
Affiliation:
Dept. of Physics (M/C 273), University of Illinois at Chicago, Chicago, IL, 60607-7059., USA
J. Zaborac
Affiliation:
Dept. of Physics (M/C 273), University of Illinois at Chicago, Chicago, IL, 60607-7059., USA
H. Moltaji
Affiliation:
Dept. of Physics (M/C 273), University of Illinois at Chicago, Chicago, IL, 60607-7059., USA
G. Duscher
Affiliation:
Dept. of Physics (M/C 273), University of Illinois at Chicago, Chicago, IL, 60607-7059., USA
N. D. Browning
Affiliation:
Dept. of Physics (M/C 273), University of Illinois at Chicago, Chicago, IL, 60607-7059., USA
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Extract

Although grain boundaries typically account for only a small fraction of a material, they can have far reaching effects on the overall bulk scale properties. These effects are usually simply linked to the boundary having a different atomic arrangement to the bulk. A necessary first step in understanding the structure-property relationships is therefore a detailed determination of the boundary structure.

One means of obtaining detailed information on the structure of grain boundaries is through correlated Z-contrast imaging and electron energy loss spectroscopy (EELS). The Z-contrast image generates a map of the grain boundary which can be used to position the probe in defined locations for spectroscopy. In the case of oxides, a structural model of the metal atom positions can be determined directly from the image. Furthermore, using a simple bond-valence sum minimization routine, the oxygen atoms can be placed so that the structure contains atoms that have valences consistent with their expected formal valence state.

Type
Spatially-Resolved Characterization of Interfaces in Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 776 - 777
Copyright
Copyright © Microscopy Society of America

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References

1.Browning, N. D., Chisholm, M. F. & Pennycook, S. J., Nature 366, 147 (1993)CrossRefGoogle Scholar
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4. Research sponsored by DOE under grant number DOE-GF02-96ER45610Google Scholar