No CrossRef data available.
Article contents
Introduction of Advanced Electron Microscopy In-situ Techniques in CAMMA
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- In Situ TEM at the Extremes
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
FIB Preparation of Samples for MEMS-based TEM Heating Experiments; By Vijayan, S, Jinschek, JR, Kujawa, S, Greiser, J and Aindow, M. Microsc Microanal. 23: 708–716 (2017).10.1017/S1431927617000605CrossRefGoogle Scholar
You have
Access