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Interfacial Atomic Number Contrast in Thick Samples

Published online by Cambridge University Press:  27 August 2014

Aniruddha Dutta
Affiliation:
Advanced Material Processing & Analysis Center (AMPAC), Department of Physics, Department of Physics, University of Central Florida, Orlando, FL, USA
Helge Heinrich
Affiliation:
Advanced Material Processing & Analysis Center (AMPAC), Department of Physics, Department of Physics, University of Central Florida, Orlando, FL, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

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[3] Dutta, A., et.al, Journal of Microscopy 251 (1) (2013), 27-34.Google Scholar
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[5] Peng, L., et.al, Acta Crystallographica A52 (1996), 456-470.Google Scholar