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Interface Study of Silver Nano-particles Using an Image Cs-corrected TEM

Published online by Cambridge University Press:  01 August 2005

D S Su ,
R Schlöegl ,
S Kujawa  and
B Freitag
D S Su
Affiliation:
Fritz-Haber Institute Berlin
R Schlöegl
Affiliation:
Fritz-Haber Institute Berlin
S Kujawa
Affiliation:
FEI
B Freitag
Affiliation:
FEI

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1550 - 1551
Copyright
© 2005 Microscopy Society of America