Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T23:55:22.114Z Has data issue: false hasContentIssue false
  • English
  • Français

Integrating Atomic Force Microscopy in Scanning Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Andrew J. Smith ,
Klaus Schock ,
Gregor Renka ,
Andreas Lieb ,
Massoud Dadras  and
Stephan Kleindiek
Andrew J. Smith
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Klaus Schock
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Gregor Renka
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Andreas Lieb
Affiliation:
Nanosurf AG, Gräubernstrasse 12–14, 4410 Liestal, Switzerland
Massoud Dadras
Affiliation:
Centre Suisse d’Électronique et de Microtechnique, CSEM SA, Neuchâtel, Switzerland
Stephan Kleindiek
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1435 - 1436
Copyright
Copyright © Microscopy Society of America 2015