No CrossRef data available.
Article contents
Integrated Simultaneous Chemical, Surface Potential, and Topographic Imaging at < 10 nm Spatial Resolution with Peak Force Infrared - Kelvin Probe Force Microscopy
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Frontiers in Spectroscopy and Microscopy Part I - Doping and Mobility
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Le, Wang, Wang, Haomin, Wagner, Martin, Yan, Yong, Jakob, Devon S. and Xiaoji, G. Xu “Nanoscale Simultaneous Chemical and Mechanical Imaging via Peak Force Infrared Microscopy” Science Advances 3, e1700255 (2017)Google Scholar
Le, Wang, Wagner, Martin, Wang, Haomin, Pau-Sanchez, Siuling, Li, Jiahan, Edgar, James H., and Xu, Xiaoji G. “Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multi-Pulse Peak Force Infrared Microscopy” Advanced Optical Materials, 1901084 (2019)10.1002/adom.201901084CrossRefGoogle Scholar
Jakob, Devon S., Le, Wang, Wang, Haomin, and Xu, Xiaoji G. “Spectro-mechanical Characterization of Aromaticity and Maturity of Kerogens in Oil Shale at 6 nm Spatial Resolution” Analytical Chemistry, 91, 14, 8883 (2019)10.1021/acs.analchem.9b00264CrossRefGoogle ScholarPubMed
You have
Access