Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-24T13:06:43.205Z Has data issue: false hasContentIssue false
  • English
  • Français

Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table

Published online by Cambridge University Press:  25 July 2016

Eric G.T. Bosch ,
Ivan Lazic  and
Sorin Lazar
Eric G.T. Bosch
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Ivan Lazic
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Sorin Lazar
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 306 - 307
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Lazić, I., Bosch, E.G.T. & Lazar, S. Ultramicroscopy 160 (2016) 265–280.Google Scholar
[2] Bosch, E.G.T. & Lazic, I. Ultramicroscopy 156 (2015) 59–72.Google Scholar
[3] Kirkland, E.J. Advanced Computing in Electron Microscopy. Springer, New York (2010) 253–260.Google Scholar