Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T16:39:17.297Z Has data issue: false hasContentIssue false
  • English
  • Français

Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

Published online by Cambridge University Press:  10 August 2018

Hidekazu Takano ,
Yukinori Nagatani ,
Songzhe Lian ,
Koh Hashimoto ,
Yanlin Wu  and
Atsushi Momose
Hidekazu Takano*
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yukinori Nagatani
Affiliation:
National Institute for Physiological Sciences, Okazaki, Japan
Songzhe Lian
Affiliation:
Faculty of Engineering, Information and Systems, University of Tsukuba, Tsukuba, Japan
Koh Hashimoto
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yanlin Wu
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Atsushi Momose
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
*
*[email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 188 - 189
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Yashiro, W., et al, Phys Rev Lett 103 2009 180801.CrossRefGoogle Scholar
[2] Kuwabara, H., et al, Appl. Phys. Express 4 2011 062502.CrossRefGoogle Scholar
[3] Takano, H., et al, Proc. SPIE 10391 2017 1039110.Google Scholar
[4] This work was supported by JST ERATO (grant No. JPMJER1403). The authors thank Carl Zeiss X-Ray Microscopy Inc. (Pleasanton, CA, USA) for help in installing the grating interferometer into the ZEISS Xradia 800 Ultra X-ray microscope.Google Scholar